Scanning electron microscopy in semiconductor research
نویسندگان
چکیده
منابع مشابه
Strain measurement in semiconductor heterostructures by scanning transmission electron microscopy.
This article deals with the measurement of strain in semiconductor heterostructures from convergent beam electron diffraction patterns. In particular, three different algorithms in the field of (circular) pattern recognition are presented that are able to detect diffracted disc positions accurately, from which the strain in growth direction is calculated. Although the three approaches are very ...
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Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a f...
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متن کاملFat uptake evaluation in fried fish fillet by using Scanning Electron Microscopy (SEM)
The aim of this study was to investigate the effects of breading materials and two different frying oils on the fat up-take in the fish fillets during frying process. Breaded and non-breaded black pomfret (Parastromateus niger) fillets were fried in sunflower oil and palm olein. Fat content by Soxhelet method and scanning electron microscopy (SEM) was studied. Results from Soxhelet method showe...
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ژورنال
عنوان ژورنال: Scanning
سال: 1993
ISSN: 0161-0457
DOI: 10.1002/sca.4950150602